Cellular Adhesion & Cytomechanics

Quantitative measurements of cell adhesion and cytomechanics



Overview

The CellHesion® module bridges the worlds of scanning probe and optical microscopy with the investigation of cell adhesion and cell mechanics phenomena. It allows the quantitative determination of cellular adhesion parameters with an unparalleled accuracy and reproducibility. As an add-on to the NanoWizard® it combines the capabilities of the BioAFM with precise adhesion force measurements and all optical microscopy features simultaneously.

Key Features

  • Add-on for the NanoWizard® AFM
  • 100µm additional z-travel
  • Hardware linearization through capacitive sensors
  • Simultaneous focus tracking
  • Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
  • Works in native environment for real in-situ measurements

Applications & Modes

Applications examples
  • Live cell imaging
  • Cell-substrate and cell-cell interactions
  • Cell membrane investigations
  • Cell adhesion and tether formation
  • Elastic properties of the cytoskeleton
  • Applications in microbiology and virus research
  • Pharmaceutical studies such as drug delivery mechanisms
  • Applications in food, paper or textile industry on fibers, coatings or powders in air or liquid
  • Single molecule studies on DNA, RNA, proteins, dendrimers, carbohydrates, lipids etc
  • Single cell force spectroscopy
  • Binding studies such as receptor/ligand or antibody/antigene
  • Intramolecular interactions protein folding, binding site localization etc
  • Biomaterial studies, biofouling, biosensors, capsules
  • Implants coatings and biochips
  • Testing functionalized surfaces
  • Soft materials studies such as degration, mechanical or electrical properties
  • Polymer and thin film imaging and mapping in air and liquid with different temperatures or liquids such as non aqueous solvents
  • Nanoparticles, nanotubes, nanocomposites, vesicles, colloids, quantum dots
  • And many more

All major AFM modes
  • Contact mode
  • Lateral Force Microscopy LFM
  • Variety of AC modes
  • Phase imaging
  • Liquid imaging
  • Force modulation mode
  • Force spectroscopy
  • Force mapping
  • Nanomanipulation
  • Nanolithography
  • Environment control with gas, liquid, temp control
  • Patented DirectOverlay™ for perfect optical integration
  • And many more

To request further Information on this product please use either the info request form or send us an email.

Alternatively you can visit JPK Instruments at http://www.jpk.com/